Pasternack’s new SOLT calibration kits are in stock and available for immediate shipping with no minimum order quantity required. 11, 2021 One-port vector-network-analyzer calibration with three-term error correction is relatively easy to understand. These new SOLT calibration kits provide the precision components that are essential to perform accurate analyzer calibrations,” said Steve Ellis, Interconnect Product Line Manager at Pasternack. One-Port VNA Calibration: A Look Under the Hood Jan. “A properly calibrated VNA is required for precise characterization of RF and microwave components used in a myriad of industries and applications. Every Pasternack calibration kit is built to withstand years of rigorous use and provides accurate RF equipment calibration for the life of the product. The new SOLT calibration kits offer excellent performance characteristics that are specially designed for the fine-tuning and calibration of sensitive test equipment in engineering labs, production environments and quality testing facilities. These RF test and measurement kits come packaged in protective wooden boxes. The kits are suitable for many vector network analyzers from the industry’s leading providers such as Agilent, Rohde & Schwarz, Anritsu and Copper Mountain. Pasternack’s expanded line of VNA calibration kits are available in 12 versions including short circuit, open circuit and load kits (SOL) as well as short circuit, open circuit, load and thru kits (SOLT) with 2.4 mm, 2.9 2mm, 3.5 mm, 7/16 DIN, 7 mm, BNC and N-Type interface options.Įach of these new VNA calibration kits from Pasternack include all of the necessary short circuit, open circuit, loads and thru (model dependent) components required for VNA calibration. Copper Mountain Technologies (CMT) pioneered metrology-grade USB VNAs in 2011 and continues to drive industry change through customer-focused solutions including a broad range of vector network analyzers, calibration kits, and accessories. A new line of short-open-load-through (SOLT) calibration kits are candidates for use in test and measurement, lab and RF and microwave production test applications.
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